中古半導体装置
2011.9.7
ID |
MANUFACTURER |
DESCRIPTION |
MODEL |
Details |
SH5001 |
KLA / TENCOR |
SURFACE PLOFILER, ALPHASTEP |
200 |
|
SH5004 |
DNS |
SPIN COATER DEVELOPER, |
SC/SDW-524-BV |
|
SH5005 |
DNS |
THICKNESS MONITOR, LAMBDA-ACE |
STM-602 |
|
SH5006 |
EBARA |
DRY PUMP |
A70W |
|
SH5008 |
ULVAC |
HE LEAK DETECTOR |
DLMS-TP |
|
SH5010 |
OLYMPUS |
MICROSCOPE |
BHC3-MJT |
|
SH5011 |
LEICA ERNST
LEITZ WETZLAR |
MICROSCOPE(オートローダー付) |
020-448.026 |
|
SH5012 |
LEICA ERNST
LEITZ WETZLAR |
MICROSCOPE |
020-448.026 |
|
SH5013 |
NANOMETRICS |
THICKNESS MONITOR |
AFT211 |
|
SH5014 |
NANOMETRICS |
THICKNESS MONITOR |
AFT211 |
|
SH5015 |
IRVINE OPTICAL
CORP (LEICA) |
MICROSCOPE |
ULTRASTATION3
(REICHERT POLYLITE 88) |
|
SH5018 |
NIKON |
OPTISTATION |
OST-3A |
|
SH5021 |
TEL |
Wafer Prober P-12XL 2sets |
2006/Mar |
|
SH5022 |
TEL |
Wafer Prober P-8L |
2000/Aug |
|
SH5023 |
TEL |
Wafer Prober P-8 |
1999/Aug |
|
SH5024 |
TEL |
Wafer Prober P-8 |
2000/Aug |
|
SH5025 |
TEL |
Wafer Prober P-8 |
2003/Aug |
|
SH5026 |
TEL |
Wafer Prober P-8 |
2000/Mar |
|
SH5027 |
TEL |
Wafer Prober P-8 |
1999/Jul |
|
SH5028 |
TEL |
Wafer Prober P-8 |
2000/Mar |
|
SH5029 |
TEL |
Wafer Prober P-8 |
1999/Sep |
|
SH5030 |
TEL |
Wafer Prober P-8 |
1999/Aug |
|
SH5031 |
TEL |
Wafer Prober P-8 |
2003/Jun |
|
SH5032 |
TEL |
Wafer Prober P-8 |
2000/Sep |
|
SH5033 |
TEL |
Wafer Prober P-8XL |
2001/Jun |
|
SH5034 |
TEL |
Wafer Prober P-8XL |
2003/Jan |
|
SH5035 |
TEL |
Wafer Prober P-8 |
2002/Jan |
|
SH5036 |
TEL |
Wafer Prober P-8 |
2000/Jul |
|
SH5037 |
TEL |
Wafer Prober P-8 |
2000/Sep |
|
SH5038 |
TEL |
Wafer Prober P-8 |
2000/Sep |
|
SH5039 |
TEL |
Wafer Prober P-8 |
2003/Jun |
|
SH5040 |
TEL |
Wafer Prober P-8 |
2000/Oct |
|
SH5041 |
TEL |
Wafer Prober P-8 |
1999/Dec |
|
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